Tuesday, January 17, 2006

Leakage takes priority at 65 nm

Leakage takes priority at 65 nm in EE Times is a nice survey of the experience of 65nm IC designs so far.

I noted that Statistical Timing Analysis was called a "must-have" technology, because of all the combinations of operating conditions when you have multiple voltage islands.

1 comment:

Sandeep said...

I wonder why SSTA is being harped on so much - the error margin and time consumption in it would be the same as doing a coarse-grained STA on hundreds of operating conditions and narrowing it down to a few candidate conditions.